Hinalea Imaging has announced the launch of the VNIR ULTRA, a next-generation visible and near-infrared (VNIR) hyperspectral imaging system designed for demanding laboratory research, microscopy, and photon-limited imaging applications.
The technology is reaching a true turning point. What was once a specialist and complex technique is now becoming more accessible, more automated, and far more powerful—driven largely by improvements in image processing software as well as the integration of machine learning and artificial intelligence.
The BREVA hexapod delivers precise six‑axis positioning for optical alignment, metrology, micro‑assembly and research applications, offering balanced performance, stability and versatility across demanding setups.
Advanced plant canopy measurements using precise, non-destructive techniques to assess plant health, light absorption, and leaf area index (LAI) and more.
The SpectraVue Leaf Spectrometer is redefining how plant science is conducted in the field. With its portable design, intuitive touchscreen interface, and powerful analytical capabilities, it bridges the gap between lab-grade precision and field-ready convenience.
The Hinalea 4300 is redefining hyperspectral imaging with its compact, high-performance design and cutting-edge Fabry-Perot tunable filter technology. Spanning the visible to shortwave infrared spectrum (500–1700 nm), it delivers real-time, full-frame imaging with exceptional spatial and spectral resolution. Whether in the lab or the field, the Hinalea 4300 empowers researchers and professionals to visualize the invisible and unlock new insights across science and industry.
Andover filters enhance applications in spectroscopy, medical imaging, machine vision, aerospace, and defence, ensuring precision, reliability and superior performance.
Radiometers, photometers, spectrometers and spectroradiometers are all used to measure light, but they operate in fundamentally different ways and have distinct advantages and disadvantages.
This technical note will discuss where and how nanopositioning devices can be used within semiconductor manufacturing processes.
By Russell Bailey, June 2024 Abstract To properly characterise and