Pro-Lite’s SphereOptics Reflectance Measurement Laboratory is equipped with two, state-of-the-art, high sensitivity Perkin Elmer UV-VIS-NIR spectrophotometers, the Lambda 950 and the Lambda 1050, both of which are equipped with integrating spheres for an 8°/H geometry for total hemispherical reflectance measurements. The Lambda 1050 is also equipped with an accessory that allows us to measure angular reflectance and BRDF.
Measurements are available for customer-supplied materials, while accredited recalibration is offered for Labsphere’s Spectralon, SphereOptics’ Zenith or other third-party reflectance standards and targets. The spectral reflectance and transmittance measurements are performed from 250 to 2450nm using a Perkin Elmer dual-beam, ratio-recording spectrophotometer, either the Lambda 950 or the Lambda 1050, which are both equipped with a 150mm Labsphere Spectralon integrating sphere for an 8°/H collection geometry.
Pro-Lite’s SphereOptics Reflectance Measurement Laboratory is equipped with state-of-the-art, high sensitivity Perkin Elmer UV-VIS-NIR spectrophotometers, either the Lambda 950 or the Lambda 1050, both of which are equipped with integrating spheres for an 8°/H geometry for total hemispherical reflectance measurements.
Measurements are available for customer-supplied samples, while accredited recalibration is offered for Labsphere Spectralon, SphereOptics Zenith or other third-party reflectance standards and targets. The spectral reflectance and transmittance measurements are performed from 250 to 2450nm using a Perkin Elmer dual-beam, ratio-recording spectrophotometer, either the Lambda 950 or the Lambda 1050, which are both equipped with a 150mm Labsphere Spectralon integrating sphere for an 8°/H collection geometry.
The measurement of spectral reflectance is performed in an 8° illumination geometry. In this configuration, the sample is mounted at the port of the integrating sphere at an angle of 8° with respect to the collimated illumination beam. This causes the specular reflection of the sample to hit the sphere wall, for specular-included (total) reflectance measurements. Alternatively, it is possible to have a light trap at the 8° position on the sphere wall for specular-excluded (diffuse-only) measurements. Subtracting the specular-excluded from the specular-included reflectance values yields the magnitude of the specular reflectance.
Reflectance measurements are performed with reference to a known, certified standard of reflectance, either NIST (USA) or PTB (Germany), depending on the type of calibration requested.
Standard measurements are performed in the range 250 to 2500nm in 1nm steps. The absolute accuracy in range 300–1750nm is better than <0.45%. The wavelength accuracy of an absorption feature is <0.75nm in range 250-1900nm.
As of April 2020, Pro-Lite’s laboratory has achieved accreditation to the DIN EN ISO/IEC 17025:2018 quality assurance standard. The laboratory now provides DAkkS-accredited measurement services for spectral reflectance in accordance with DIN 5036 Part 3 11.79 for diffusely reflecting materials in the wavelength range from 250 to 2450nm (UV-VIS-NIR bands). Ours is the first commercial laboratory in Europe to achieve ISO accreditation for the measurement and calibration of total hemispherical reflectance in both specular-included and specular-excluded geometries in accordance with DIN 5036.
Key Features of the Reflectance Measurement Service
Measurement Types | Total hemispheric reflectance Specular-only reflectance Diffuse-only reflectance Total hemispheric transmittance |
Compliance | According to DIN 5036 Part 3: 11.79 for diffusely reflecting materials |
By Special Request | Total hemispheric reflectance as a function of angle of illumination |
Wavelength Range | 250-2450nm |
Recording Interval | 1nm |
Measurement Geometry | 8°/H (directional illumination at 8° to sample normal with total hemispheric collection) |
Sample Dimensions | Solid materials, 28-100mm diameter, up to 40mm thick, ideally flat (some curvature may be acceptable) |
Data Provided | Printed test report and on digital media |
Traceability | All reflectance measurements are made by substitution to reference artifacts that are calibrated by an NMI (e.g. NIST or PTB) |
Accreditation | Optional – calibration services can be ordered under our DAkkS DIN EN ISO/IEC 17025:2018 scope of accreditation |
We would be delighted to quote for your reflectance measurement and calibration requirements. Please provide as much information as possible about your needs. Please share at least the following information with us by email to info@pro-lite.co.uk.
What Type of Measurement is Required? | As standard we can perform measurements of total hemispherical reflectance, specular reflectance, diffuse reflectance and total hemispherical transmittance. By special arrangement we can also provide measurements of total hemispherical reflectance as a function of angle of illumination |
What is the Required Wavelength Range? | Our standard measurements are performed between 250 to 2450nm |
Do you Require an Accredited Measurement? | We offer both a standard service as well as an optional service that is performed within the scope of our DAkkS ISO 17025 accreditation |
What are the Sample Dimensions? | Ideally, your samples shall be flat, 28-100mm diameter (or square) and no more than 40mm thick. Other shapes/sizes by special arrangement |
How Many Items do you Need Testing? |
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Reporting | What information do you need reporting? Do you need CIELAB colour values (L*a*b*)? As standard, we provide a printed test report as well as reflectance data compiled every 1nm on digital media |
Anything Else? | Please let us know if there are any other requirements! |
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